Cite
HARVARD Citation
Belikov, S. et al. (2020). Image-Based Parametric Pattern Recognition for Micro- and Nano- Defect Detection. IFAC-PapersOnLine. 53 (2), pp. 8591-8598. [Online].
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Belikov, S. et al. (2020). Image-Based Parametric Pattern Recognition for Micro- and Nano- Defect Detection. IFAC-PapersOnLine. 53 (2), pp. 8591-8598. [Online].