A stable LaB6 nanoneedle field-emission electron source for atomic resolution imaging with a transmission electron microscope. (July 2022)

• Record Type: Journal Article
• Authors: Tang, Shuai; Tang, Jie; Okunishi, Eiji; Ninota, Yuki; Yasuhara, Akira; Uzuhashi, Jun; Ohkubo, Tadakatsu; Takeguchi, Masaki; Yuan, Jinshi; Qin, Lu-Chang
• Is Part Of: Materials today. Volume 57(2022)
• Page Start: 35
• Page End: 42
• Publication Date: 2022-07
• Subjects: LaB6 nanoneedle -- Electron source -- Electron microscopy -- Stable emission -- Atomic resolution; Materials science -- Periodicals; Metallurgy -- Periodicals; Metal-work -- Periodicals; Biomedical and Dental Materials -- Periodicals; Manufactured Materials -- Periodicals; Metals -- Periodicals; 620.11
• DOI: 10.1016/j.mattod.2022.06.003
• Languages: English
• ISSNs: 1369-7021

Abstract

Graphical abstract: Abstract: Field-induced electron emission offers the best performance point electron source for electron microscopes. Herewith we report a new cold field-emission point electron source utilizing a nanoneedle made of lanthanum hexaboride (LaB6 ) and its implementation in a spherical aberration-corrected transmission electron microscope (TEM). A sub-ångstrom resolution of 0.96 Å has been obtained with the TEM operated at an acceleration voltage of 60 kV and a smaller energy spread was also observed compared with the contemporary W(310) electron source. In particular, the LaB6 nanoneedle cold field-emission electron source required no thermal flashing for continuous operation of extended hours (>100 hours) while exhibiting and sustaining a high stability in emission current (<1%). We attribute the excellent performance of the LaB6 nanoneedle electron source to (i) a low work function of LaB6 ; (ii) excellent alignment of the nanoneedle emitter by the electron and ion dual-beam processing with nanoscale precision and (iii) robustness of the nanometric structure that suppressed mechanical vibrations of the LaB6 emitter even in a high electric field. This new LaB6 nanoneedle cold field-emission electron source enables stable high-resolution imaging in TEM and it will also benefit cryogenic electron microscopy, scanning electron microscopy, electron beam lithography, and other electron beam technologies.