A Test Data Compression Scheme Based on Irrational Numbers Stored Coding. (28th August 2014)

• Record Type: Journal Article
• Authors: Wu, Hai-feng; Cheng, Yu-sheng; Zhan, Wen-fa; Cheng, Yi-fei; Wu, Qiong; Zhu, Shi-juan
• Other Names: Yin Yunqiang Academic Editor.
• Is Part Of: TheScientificWorldjournal. Volume 2014(2014)
• Publication Date: 2014-08-28
• Subjects: Science -- Periodicals; Technology -- Periodicals; Medicine -- Periodicals; 505
• DOI: 10.1155/2014/982728
• Languages: English
• ISSNs: 2356-6140

Abstract

Abstract : Test question has already become an important factor to restrict the development of integrated circuit industry. A new test data compression scheme, namely irrational numbers stored (INS), is presented. To achieve the goal of compress test data efficiently, test data is converted into floating-point numbers, stored in the form of irrational numbers. The algorithm of converting floating-point number to irrational number precisely is given. Experimental results for some ISCAS 89 benchmarks show that the compression effect of proposed scheme is better than the coding methods such as FDR, AARLC, INDC, FAVLC, and VRL.