An On‐Chip Break Junction System for Combined Single‐Molecule Conductance and Raman Spectroscopies. (25th May 2020)
- Record Type:
- Journal Article
- Title:
- An On‐Chip Break Junction System for Combined Single‐Molecule Conductance and Raman Spectroscopies. (25th May 2020)
- Main Title:
- An On‐Chip Break Junction System for Combined Single‐Molecule Conductance and Raman Spectroscopies
- Authors:
- Jeong, Hyunhak
Li, Haipeng B.
Domulevicz, Lucas
Hihath, Joshua - Abstract:
- Abstract: Systems that are capable of robustly reproducing single‐molecule junctions are an essential prerequisite for enabling the wide‐spread testing of molecular electronic properties, the eventual application of molecular electronic devices, and the development of single‐molecule based electrical and optical diagnostics. Here, a new approach is proposed for achieving a reliable single‐molecule break junction system by using a microelectromechanical system device on a chip. It is demonstrated that the platform can (i) provide subnanometer mechanical resolution over a wide temperature range (≈77–300 K), (ii) provide mechanical stability on par with scanning tunneling microscopy and mechanically controllable break junction systems, and (iii) operate in a variety of environmental conditions. Given these fundamental device performance properties, the electrical characteristics of two standard molecules (hexane‐dithiol and biphenyl‐dithiol) at the single‐molecule level, and their stability in the junction at both room and cryogenic temperatures (≈77 K) are studied. One of the possible distinctive applications of the system is demonstrated, i.e., observing real‐time Raman scattering in a single‐molecule junction. This approach may pave a way to achieving high‐throughput electrical characterization of single‐molecule devices and provide a reliable platform for the convenient characterization and practical application of single‐molecule electronic systems in the future. AbstractAbstract: Systems that are capable of robustly reproducing single‐molecule junctions are an essential prerequisite for enabling the wide‐spread testing of molecular electronic properties, the eventual application of molecular electronic devices, and the development of single‐molecule based electrical and optical diagnostics. Here, a new approach is proposed for achieving a reliable single‐molecule break junction system by using a microelectromechanical system device on a chip. It is demonstrated that the platform can (i) provide subnanometer mechanical resolution over a wide temperature range (≈77–300 K), (ii) provide mechanical stability on par with scanning tunneling microscopy and mechanically controllable break junction systems, and (iii) operate in a variety of environmental conditions. Given these fundamental device performance properties, the electrical characteristics of two standard molecules (hexane‐dithiol and biphenyl‐dithiol) at the single‐molecule level, and their stability in the junction at both room and cryogenic temperatures (≈77 K) are studied. One of the possible distinctive applications of the system is demonstrated, i.e., observing real‐time Raman scattering in a single‐molecule junction. This approach may pave a way to achieving high‐throughput electrical characterization of single‐molecule devices and provide a reliable platform for the convenient characterization and practical application of single‐molecule electronic systems in the future. Abstract : A novel on‐chip single‐molecule break junction system based on a microelectromechanical system (MEMS‐BJ) is fabricated using a conventional semiconductor manufacturing process on a silicon‐on‐insulator wafer. Compared with conventional single‐molecule junction testbeds, the MEMS‐BJ system provides better optical accessibility and scalability but requires a smaller apparatus, which makes it a reliable platform for the convenient characterization and practical application of single‐molecule electronic systems. … (more)
- Is Part Of:
- Advanced functional materials. Volume 30:Number 28(2020)
- Journal:
- Advanced functional materials
- Issue:
- Volume 30:Number 28(2020)
- Issue Display:
- Volume 30, Issue 28 (2020)
- Year:
- 2020
- Volume:
- 30
- Issue:
- 28
- Issue Sort Value:
- 2020-0030-0028-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2020-05-25
- Subjects:
- cryogenic characterization -- electrical characterization -- micro‐electromechanical system -- Raman spectroscopy -- single‐molecule junction
Materials -- Periodicals
Chemical vapor deposition -- Periodicals
620.11 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1616-3028 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/adfm.202000615 ↗
- Languages:
- English
- ISSNs:
- 1616-301X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0696.853900
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 23472.xml