Structural pattern‐based approach for Betacam dropout detection in degraded archived media. Issue 1 (1st January 2019)
- Record Type:
- Journal Article
- Title:
- Structural pattern‐based approach for Betacam dropout detection in degraded archived media. Issue 1 (1st January 2019)
- Main Title:
- Structural pattern‐based approach for Betacam dropout detection in degraded archived media
- Authors:
- Song, Gihun
Roy, Kaushik
Ahn, Kiok
Wadud, M. Abdullah‐Al‐
Iqbal, Md. Tauhid Bin
Chae, Oksam - Abstract:
- Abstract : Detection of Betacam dropout defects that can occur in the digitisation process of old archived media has importance in the restoration of degraded data to a higher quality. Most of the existing methods rely on the temporal information of multiple consecutive frames to detect Betacam dropouts, which sometimes may not work well as several successive frames may contain a Betacam error at the same position. In this study, an automatic method of Betacam dropout error detection is proposed based on vertical patterns in a single frame. Hence, it is also applicable when temporal information‐based detectors fail. The results of performance tests done in real working environments demonstrate that the proposed Betacam dropout detection method performs much better than the existing methods.
- Is Part Of:
- IET image processing. Volume 13:Issue 1(2019)
- Journal:
- IET image processing
- Issue:
- Volume 13:Issue 1(2019)
- Issue Display:
- Volume 13, Issue 1 (2019)
- Year:
- 2019
- Volume:
- 13
- Issue:
- 1
- Issue Sort Value:
- 2019-0013-0001-0000
- Page Start:
- 224
- Page End:
- 232
- Publication Date:
- 2019-01-01
- Subjects:
- information retrieval systems -- records management
degraded archived media -- Betacam dropout defects -- digitisation process -- old archived media -- degraded data -- multiple consecutive frames -- successive frames -- automatic method -- Betacam dropout error detection -- vertical patterns -- single frame -- temporal information‐based detectors -- Betacam dropout detection method -- structural pattern‐based approach
Image processing -- Periodicals
621.36705 - Journal URLs:
- http://digital-library.theiet.org/content/journals/iet-ipr ↗
http://ieeexplore.ieee.org/servlet/opac?punumber=4149689 ↗
http://www.ietdl.org/IET-IPR ↗
https://ietresearch.onlinelibrary.wiley.com/journal/17519667 ↗
http://www.theiet.org/ ↗ - DOI:
- 10.1049/iet-ipr.2018.5859 ↗
- Languages:
- English
- ISSNs:
- 1751-9659
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 4363.252600
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 23463.xml