Revisiting and improvement of thru‐reflect‐line calibration for accurate measurement of substrate integrated waveguide components. Issue 1 (1st January 2017) - Chen, Haidong
Abstract : Thru‐reflect‐line (TRL) calibration method were reviewed and the related kits based on substrate integrated waveguide (SIW) were re‐examined, designed, and compared for measurements of SIW circuits. Different types of calibration kits were discussed and the design guidelines were provided. Filters working at 5 and 10 GHz were designed for the verification purpose of these calibration kits. Meanwhile, the TRL calibration method based on uniform SIW‐coaxial transitions was proposed, which shows improved measurement accuracy.