A new lock-in amplifier-based deep-level transient spectroscopy test and measurement system for solar cells. (15th September 2022)

• Record Type: Journal Article
• Authors: Jia, Yun; Ding, Xiaolei; Wang, Rui; Wang, Youyang; Zheng, Shiqi; Hu, Xiaobo; Weng, Guoen; Chen, Shaoqiang; Sakurai, Takeaki; Akiyama, Hidefumi
• Is Part Of: Solar energy. Volume 244(2022)
• Page Start: 507
• Page End: 515
• Publication Date: 2022-09-15
• Subjects: DLTS system -- Deep level defects -- Solar cells -- Sb2S3 -- CIGS; Solar energy -- Periodicals; Solar engines -- Periodicals; 621.47
• DOI: 10.1016/j.solener.2022.08.062
• Languages: English
• ISSNs: 0038-092X

Abstract

Highlights: A new and widely-used lock-in amplifier-based DLTS system has been developed. Part of the DLTS system setup is discussed. One electron trap and one hole trap are found in Sb2 S3 and CIGS solar cells. This established DLTS system provides a better solution for characterizing defect information of solar cells. Abstract: A new, widely-used, lock-in amplifier-based deep-level transient spectroscopy (DLTS) test and measurement system has been developed that efficiently digitizes and analyzes through conventional DLTS methods. The fundamental principle of DLTS, using the n + p diode, is introduced first. Part of the DLTS system setup is discussed in terms of the accuracy, optimization, and processing of measurement results. The established system is subsequently applied to study deep-level traps in the antimony sulfide (Sb2 S3 ) and the Copper Indium Gallium Selenium (CIGS) thin-film solar cell. One electron trap and one hole trap were found in each of the two solar cells, and the calculated results are within a reasonable range compared with previous reports. It is shown experimentally that the DLTS system can be employed in a variety of test scenarios and the results are fundamentally in agreement with the mainstream system performance.