X-Ray Small Target Security Inspection Based on TB-YOLOv5. (2nd August 2022)

• Record Type: Journal Article
• Authors: Wang, Muchen; Zhu, Yueming; Liu, Yongkang; Deng, Huiping
• Other Names: Khan Mohammad Ayoub Academic Editor.
• Is Part Of: Security and communication networks. Volume 2022(2022)
• Publication Date: 2022-08-02
• Subjects: Computer networks -- Security measures -- Periodicals; Computer security -- Periodicals; Cryptography -- Periodicals; 005.805
• DOI: 10.1155/2022/2050793
• Languages: English
• ISSNs: 1939-0114

Abstract

Abstract : Security inspection is extremely important for the safety of public places. In this research, we are trying to propose a novel algorithm and investigated theoretically in the X-ray dataset, which can optimize the relative low detection accuracy and the latent omission detection of smaller objects when using You Only Look Once version 5 (YOLOv5). For one side, the transform detection network is selected to be added at the bottom layer of backbone structure to avoid the loss of useful information during sequential calculation. On another side, we attempt to adjust the existing PANet structural elements of the model, including their connections and other related parameters to improve the detection performance. We integrate an efficient BiFPN with the CA mechanism, which can enhance feature extraction, and named it attention-BiFPN. Experimental consequences demonstrate that the detection accuracy of the proposed model, which we name "TB-YOLOv5, " has obvious advantages in check performance compared with the mainstream one-stage object detection models. Meanwhile, compared with YOLOv5, the data results display an improvement of up to 14.9%, and the average precision at 0.5 IOU even reached 23.4% higher in the region of small object detection. Our purpose was to explore the potential of changing a popular detection algorithm such as YOLO to address specific tasks and provide insights on how specialized adjustments can influence the detection of small objects. Our work can supply an effective method of enhancing the performance of X-ray security inspection and show promising potential for deep learning in related fields.