Investigation of microstructure and residual stress development during laser surface melting of AH36 steel using 3-D fully coupled numerical model. (15th November 2022)

• Record Type: Journal Article
• Authors: Yeo, Haram; Son, Myeonggyun; Ki, Hyungson
• Is Part Of: International journal of heat and mass transfer. Volume 197(2022)
• Publication Date: 2022-11-15
• Subjects: Laser surface melting -- Residual stress -- Microstructure -- Melt flow -- Fully coupled approach; Heat -- Transmission -- Periodicals; Mass transfer -- Periodicals; Chaleur -- Transmission -- Périodiques; Transfert de masse -- Périodiques; Electronic journals; 621.4022
• DOI: 10.1016/j.ijheatmasstransfer.2022.123366
• Languages: English
• ISSNs: 0017-9310

Abstract

Highlights: A 3-D fully coupled numerical model for laser melting process was developed. Temperature, melt flow, microstructure and stress fields during the process were computed. 2-D residual stress distributions were measured using the contour method. Abstract: In this study, the microstructure and residual stress development during the laser surface melting process is investigated using a three-dimensional fully coupled numerical model. With a fully coupled model, unlike a sequentially coupled model, the evolution of the temperature, melt flow, microstructure, and stress fields during the entire melting process is computed by directly accounting for their mutual interactions. Therefore, the developed numerical model can reflect the actual laser melting process and predict the solid-state phase transformation and stress development during the process. Laser surface melting experiments are performed on AH36 steel using a 2 kW fiber laser with a rectangular top-hat profile. Residual stresses are measured using the contour method, and the microstructure distributions are examined using an optical microscope. Three process conditions are examined, including a high laser energy condition and an extremely low processing speed, to validate the model. The simulation results agree well with the measurement data.