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HARVARD Citation
Piliougine, M. et al. (2022). Analysis of the degradation of amorphous silicon‐based modules after 11 years of exposure by means of IEC60891:2021 procedure 3. Progress in photovoltaics. pp. 1176-1187. [Online].
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Piliougine, M. et al. (2022). Analysis of the degradation of amorphous silicon‐based modules after 11 years of exposure by means of IEC60891:2021 procedure 3. Progress in photovoltaics. pp. 1176-1187. [Online].