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HARVARD Citation
Duoli, L. et al. (2019). A probabilistic analysis technique for single event transient sensitivity evaluation of phase-lock-loops. Microelectronics and reliability. p. . [Online].
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Duoli, L. et al. (2019). A probabilistic analysis technique for single event transient sensitivity evaluation of phase-lock-loops. Microelectronics and reliability. p. . [Online].