Cite
HARVARD Citation
Nowakowski, P. et al. (n.d.). Metrology of Sample Preparation for Electron Microscopy: Application to Strain Measurements. Microscopy and microanalysis. pp. 768-770. [Online].
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Nowakowski, P. et al. (n.d.). Metrology of Sample Preparation for Electron Microscopy: Application to Strain Measurements. Microscopy and microanalysis. pp. 768-770. [Online].