Cite
HARVARD Citation
Lee, K. et al. (2022). Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications. Advanced materials interfaces. 9 (9), p. n/a. [Online].
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Lee, K. et al. (2022). Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications. Advanced materials interfaces. 9 (9), p. n/a. [Online].