Improvement of in-plane uniformity of cathodoluminescence from ZnO luminescent layers for electron beam excitation assisted optical microscope. (14th May 2021)

• Record Type: Journal Article
• Authors: Nakamura, Atsushi; Inami, Wataru; Yamamoto, Ryo; Imai, Yuma; Kobayashi, Shun; Kawata, Yoshimasa
• Is Part Of: Japanese journal of applied physics. Volume 60:Number 6(2021)
• Publication Date: 2021-05-14
• Subjects: ZnO -- Atomic layer deposition (ALD) -- Cathodoluminescence -- electron beam excitation-assisted optical microscope (EXA) -- ZnO/Al2O3 heterostructure; Physics -- Periodicals; 621.05
• DOI: 10.35848/1347-4065/abfc5f
• Languages: English
• ISSNs: 0021-4922

Abstract

Abstract: We fabricated flat and homogeneous Al2 O3 /ZnO/Al2 O3 heterostructure luminescent layers by atomic layer deposition (ALD) to serve as a nanometer-scaled light source for high-spatial-resolution optical microscopy based on electron beam excitation (EXA). A smooth surface was obtained by inserting an Al2 O3 buffer layer and an Al2 O3 barrier layer resulting in brighter and more uniform cathodoluminescence (CL) compared with that from a directly deposited ZnO layer. The root mean square (rms) value determined by atomic force microscope drastically decreased from 2.4 nm (for typical ZnO film) to 0.5 nm (for the six-layer pairs of the Al2 O3 /ZnO/Al2 O3 heterostructure). The CL brightness increased by two times of that in the Al2 O3 /ZnO/Al2 O3 heterostructure due to a waveguide effect. However, the increase in the number of the layer pairs from one to six reduced the CL brightness by half. The CL emission variability was about 30% improved that is supposed to enable high-resolution using Al2 O3 /ZnO/Al2 O3 luminescent layers for an EXA microscope.