Cite
HARVARD Citation
Lee, C. et al. (2016). Noise Parameter Analysis of SiGe HBTs for Different Sizes in the Breakdown Region. Active and passive electronic components. p. . [Online].
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Lee, C. et al. (2016). Noise Parameter Analysis of SiGe HBTs for Different Sizes in the Breakdown Region. Active and passive electronic components. p. . [Online].