XPS Depth Study on the Liquid Oxidation of Sn-Bi-Zn-X(Al/P) Alloy and the Effect of Al/P on the Film. (8th July 2015)

• Record Type: Journal Article
• Authors: Wang, X. J.; Liu, N.; Shi, S.; Chen, Y. X.
• Other Names: Dinia Aziz Academic Editor.
• Is Part Of: Advances in materials science and engineering. Volume 2015(2015)
• Publication Date: 2015-07-08
• Subjects: Materials science -- Periodicals; Materials science; Periodicals; 620.11
• DOI: 10.1155/2015/257231
• Languages: English
• ISSNs: 1687-8434

Abstract

Abstract : X-ray photoelectron spectroscopy (XPS) was used to study the properties of liquid oxidation of Sn-Bi-Zn (SBZ) solder alloys and the effect of Al/P on the oxide film. The results showed that the oxidation film on SBZ surface was in high concentration of both oxygen and zinc. Adding trace amount of Al/P to SBZ alloys (SBZA/ABZP) decreased the ratio of O/M (M could be Sn, Bi, and Al/P) and changed the film compositions. Layers near the free surface of oxidation film mostly contained Zn 2+ and Al 3+ oxides for SBZA. From the half quantitative analysis result, the aluminum had a surface enrichment behavior in liquid solder, so did phosphorus and zinc. Therefore, the Al/P addition changed their stoichiometry such as the ratio of O/M near film surface.