Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy. (August 2022)
- Record Type:
- Journal Article
- Title:
- Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy. (August 2022)
- Main Title:
- Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy
- Authors:
- Ilett, Martha
Freeman, Helen
Aslam, Zabeada
Afzali, Maryam
Galloway, Joanna
Meldrum, Fiona
Brydson, Rik - Abstract:
- Is Part Of:
- Microscopy and microanalysis. Volume 28(2022)Supplement 1
- Journal:
- Microscopy and microanalysis
- Issue:
- Volume 28(2022)Supplement 1
- Issue Display:
- Volume 28, Issue 1 (2022)
- Year:
- 2022
- Volume:
- 28
- Issue:
- 1
- Issue Sort Value:
- 2022-0028-0001-0000
- Page Start:
- 2202
- Page End:
- 2202
- Publication Date:
- 2022-08
- Subjects:
- Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82 - Journal URLs:
- https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗ - DOI:
- 10.1017/S1431927622008509 ↗
- Languages:
- English
- ISSNs:
- 1431-9276
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 22841.xml