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HARVARD Citation
Matthews, B. et al. (n.d.). Quantifying Defect Pathways for Disorder in La1-xSrxFeO3 / SrTiO3 Thin Films. Microscopy and microanalysis. pp. 2108-2109. [Online].
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Matthews, B. et al. (n.d.). Quantifying Defect Pathways for Disorder in La1-xSrxFeO3 / SrTiO3 Thin Films. Microscopy and microanalysis. pp. 2108-2109. [Online].