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HARVARD Citation
Zhang, D. et al. (2018). High Reliability and Fast-Speed Phase-Change Memory Based on Sb70Se30/SiO2 Multilayer Thin Films. Advances in materials science and engineering. p. . [Online].
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Zhang, D. et al. (2018). High Reliability and Fast-Speed Phase-Change Memory Based on Sb70Se30/SiO2 Multilayer Thin Films. Advances in materials science and engineering. p. . [Online].