A De-Embedding Procedure to Determine the Equivalent Circuit Parameters of RF CNTFETs. (1st January 2016)
- Record Type:
- Journal Article
- Title:
- A De-Embedding Procedure to Determine the Equivalent Circuit Parameters of RF CNTFETs. (1st January 2016)
- Main Title:
- A De-Embedding Procedure to Determine the Equivalent Circuit Parameters of RF CNTFETs
- Authors:
- Marani, R.
Perri, A. G. - Abstract:
- Abstract : In this paper we present a de-embedding procedure in order to determine the equivalent circuit parameters of CNTFETs for RF applications. This proposed technique allows to remove random errors in measured S parameters of small-signal device: in this way the intrinsic model of CNTFETs can be implement directly in simulation software.
- Is Part Of:
- ECS journal of solid state science and technology. Volume 5:Number 5(2016)
- Journal:
- ECS journal of solid state science and technology
- Issue:
- Volume 5:Number 5(2016)
- Issue Display:
- Volume 5, Issue 5 (2016)
- Year:
- 2016
- Volume:
- 5
- Issue:
- 5
- Issue Sort Value:
- 2016-0005-0005-0000
- Page Start:
- M31
- Page End:
- M34
- Publication Date:
- 2016-01-01
- Subjects:
- CNTFETs -- Modelling -- Nanoelectronic Devices -- RF Characterization -- S parameters
Solid state chemistry -- Periodicals
Electronics -- Materials -- Periodicals
Electrochemistry -- Periodicals
541.0421 - Journal URLs:
- https://iopscience.iop.org/journal/2162-8777 ↗
http://www.electrochem.org/ ↗ - DOI:
- 10.1149/2.0121605jss ↗
- Languages:
- English
- ISSNs:
- 2162-8777
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 22779.xml