Study of Agglomeration Behavior of Chemical Mechanical Polishing Slurry under Controlled Shear Environments. (1st January 2018)
- Record Type:
- Journal Article
- Title:
- Study of Agglomeration Behavior of Chemical Mechanical Polishing Slurry under Controlled Shear Environments. (1st January 2018)
- Main Title:
- Study of Agglomeration Behavior of Chemical Mechanical Polishing Slurry under Controlled Shear Environments
- Authors:
- J. Khanna, Aniruddh
Gupta, Sushant
Kumar, Purushottam
Chang, Feng-Chi
Singh, Rajiv K. - Abstract:
- Abstract : The presence of large oversize particles (>0.5 μm) in the slurry is known to cause polishing defects during chemical mechanical planarization/polishing (CMP) process. One of the reasons for presence of large particles in the slurry is due to usage of pumps during slurry delivery. The shear rate of pumps is known to cause agglomeration problem in CMP slurries, with increasing shear rate leading to increase in agglomeration in the slurries. However, till now all the work on shear-induced agglomeration has been qualitative or at best semi-quantitative in nature. In the present work, a novel technique to study agglomeration behavior as a function of quantified shear rates has been developed. A rheometer was used as a means to subject slurry to different shear rates for various times. The resulting change in oversize particle distribution was measured using a single particle optical sensing (SPOS) system. It was observed that the behavior of silica slurry when subjected to different shear rates falls into three regions namely de-agglomeration, transition region and agglomeration region. This technique provides a deterministic way for slurry stability and can be used as a guide for design of slurry, slurry selection and design of slurry delivery systems.
- Is Part Of:
- ECS journal of solid state science and technology. Volume 7:Number 5(2018)
- Journal:
- ECS journal of solid state science and technology
- Issue:
- Volume 7:Number 5(2018)
- Issue Display:
- Volume 7, Issue 5 (2018)
- Year:
- 2018
- Volume:
- 7
- Issue:
- 5
- Issue Sort Value:
- 2018-0007-0005-0000
- Page Start:
- P238
- Page End:
- P242
- Publication Date:
- 2018-01-01
- Subjects:
- Agglomeration -- oversize particles -- Chemical Mechanical Planarization -- Chemical Mechanical Polishing -- CMP Defects -- Sapphire -- low-k -- CMP Slurry -- slurry handling -- slurry delivery
Solid state chemistry -- Periodicals
Electronics -- Materials -- Periodicals
Electrochemistry -- Periodicals
541.0421 - Journal URLs:
- https://iopscience.iop.org/journal/2162-8777 ↗
http://www.electrochem.org/ ↗ - DOI:
- 10.1149/2.0091805jss ↗
- Languages:
- English
- ISSNs:
- 2162-8777
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 22777.xml