Characterization of Grapho-Silicidation on n+ 4H-SiC C-Face for Back Side Ohmic Contacts of Power Devices. (1st January 2016)

• Record Type: Journal Article
• Authors: De Silva, Milantha; Maeda, Tomonori; Ishikawa, Seiji; Sezaki, Hiroshi; Miyazaki, Takamichi; Kikkawa, Takamaro; Kuroki, Shin-Ichiro
• Is Part Of: ECS journal of solid state science and technology. Volume 5:Number 9(2016)
• Page Start: P457
• Page End: P460
• Publication Date: 2016-01-01
• Subjects: Amorphization -- ion implantation -- Ohimic contact -- SiC -- Silicidation; Solid state chemistry -- Periodicals; Electronics -- Materials -- Periodicals; Electrochemistry -- Periodicals; 541.0421
• DOI: 10.1149/2.0091609jss
• Languages: English
• ISSNs: 2162-8777

Abstract

Abstract : In this research, a novel grapho-silicidation is introduced to form a low resistance ohmic contact for n + 4H-SiC power semiconductor devices. In this method, amorphous line and space patterns with sizes of 100 nm and 200 nm were formed in SiC substrate with ion implantation, and Ni silicide was formed on the SiC substrate. By the grapho-silicidation, carbon agglomeration was controlled, and low contact resistance of 1.9 × 10 −3 Ωcm 2 was realized.