Trade-Off between Gate Oxide Integrity and Transistor Performance for FinFET Technology. (1st January 2017)

• Record Type: Journal Article
• Authors: Lo, Hsien-Ching; Peng, Jianwei; Yong, Chloe; Uppal, Suresh; Qi, Yi; Zhan, Hui; Shen, Yan Ping; Chen, Xiaobo; Yan, Jianghu; Zhu, Baofu; Shintri, Shashidhar; Yamaguchi, Shimpei; Bhat, Talapady; Hong, Wei; Shi, Yong Jun; Regonda, Suresh; Choi, Dongil; Hu, Owen; Joshi, Manoj; Samavedam, Srikanth
• Is Part Of: ECS journal of solid state science and technology. Volume 6:Number 8(2017)
• Page Start: N137
• Page End: N141
• Publication Date: 2017-01-01
• Subjects: eSiGe -- FinFET -- gate oxide integrity -- Vbd -- VRS; Solid state chemistry -- Periodicals; Electronics -- Materials -- Periodicals; Electrochemistry -- Periodicals; 541.0421
• DOI: 10.1149/2.0011709jss
• Languages: English
• ISSNs: 2162-8777

Abstract

Abstract : This work reports that, for the first time, the engineering of eSiGe proximity and eSiGe layer-one (L1) thickness modulates gate oxide integrity and device performance simultaneously in the leading edge FinFET technology. It is observed that there is a tradeoff between the benefit of transistor performance and the cost of gate oxide breakdown voltage (Vbd) degradation. TEM analysis indicates that eSiGe L1 is exposed to interfacial-layer/high-K in replaced-metal-gate (RMG) processes, suggesting gate oxide Vbd is compromised by germanium oxide formation at the L1 and high-k boundary. Thus, the strategy of FinFET junction optimization needs to consider not only transistor performance but also the gate oxide integrity.