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HARVARD Citation
Shiojima, K. et al. (2022). Estimation of uniformity in Schottky contacts between printed Ni electrode and n-GaN by scanning internal photoemission microscopy. Japanese journal of applied physics. p. . [Online].
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Shiojima, K. et al. (2022). Estimation of uniformity in Schottky contacts between printed Ni electrode and n-GaN by scanning internal photoemission microscopy. Japanese journal of applied physics. p. . [Online].