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HARVARD Citation
Kirste, L. et al. (2015). (Invited) Synchrotron White-Beam X-Ray Topography Analysis of the Defect Structure of HVPE-GaN Substrates. ECS transactions. pp. 93-106. [Online].
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Kirste, L. et al. (2015). (Invited) Synchrotron White-Beam X-Ray Topography Analysis of the Defect Structure of HVPE-GaN Substrates. ECS transactions. pp. 93-106. [Online].