Cite
HARVARD Citation
Kim, C. et al. (2017). Comparative Analysis of SnOx Thin Films Deposited by RF Reactive Sputtering with Different SnO/Sn Target Compositions. ECS journal of solid state science and technology. pp. P765-P771. [Online].
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Kim, C. et al. (2017). Comparative Analysis of SnOx Thin Films Deposited by RF Reactive Sputtering with Different SnO/Sn Target Compositions. ECS journal of solid state science and technology. pp. P765-P771. [Online].