Erratum: The Impact of Different Si Surface Terminations in the (001) n-Si/NiOx Heterojunction on the Oxygen Evolution Reaction (OER) by XPS and Electrochemical Methods [J. Electrochem. Soc., 165, H3122 (2018)]. Issue 2 (1st January 2018)

Record Type:: Journal Article
Title:: Erratum: The Impact of Different Si Surface Terminations in the (001) n-Si/NiOx Heterojunction on the Oxygen Evolution Reaction (OER) by XPS and Electrochemical Methods [J. Electrochem. Soc., 165, H3122 (2018)]. Issue 2 (1st January 2018)
Main Title:: Erratum: The Impact of Different Si Surface Terminations in the (001) n-Si/NiOx Heterojunction on the Oxygen Evolution Reaction (OER) by XPS and Electrochemical Methods [J. Electrochem. Soc., 165, H3122 (2018)]
Authors:: Tengeler, Sven
Fingerle, Mathias
Calvet, Wolfram
Steinert, Celine
Kaiser, Bernhard
Mayer, Thomas
Jaegermann, Wolfram
Abstract:
Is Part Of:: Journal of the Electrochemical Society. Volume 165:Issue 2(2018)
Journal:: Journal of the Electrochemical Society
Issue:: Volume 165:Issue 2(2018)
Issue Display:: Volume 165, Issue 2 (2018)
Year:: 2018
Volume:: 165
Issue:: 2
Issue Sort Value:: 2018-0165-0002-0000
Page Start:: X2
Page End:: X2
Publication Date:: 2018-01-01
Subjects:: Erratum
Electrochemistry -- Periodicals
541.3705
Journal URLs:: https://iopscience.iop.org/journal/1945-7111?gclid=EAIaIQobChMI4Y-UmqGC7wIVFeDtCh0VQAo7EAAYASAAEgLW8_D_BwE ↗
DOI:: 10.1149/2.1211802jes ↗
Languages:: English
ISSNs:: 0013-4651
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 22729.xml