Cite
HARVARD Citation
Kissinger, G. et al. (2015). Investigation of the Copper Gettering Mechanism of Oxide Precipitates in Silicon. ECS journal of solid state science and technology. pp. N124-N129. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Kissinger, G. et al. (2015). Investigation of the Copper Gettering Mechanism of Oxide Precipitates in Silicon. ECS journal of solid state science and technology. pp. N124-N129. [Online].