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HARVARD Citation
Mukherjee, C. et al. (2020). A unified aging compact model for hot carrier degradation under mixed-mode and reverse E-B stress in complementary SiGe HBTs. Solid-state electronics. p. . [Online].
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Mukherjee, C. et al. (2020). A unified aging compact model for hot carrier degradation under mixed-mode and reverse E-B stress in complementary SiGe HBTs. Solid-state electronics. p. . [Online].