A simple empirical algorithm for optimising depletion power and resolution for dye and system specific STED imaging. (9th May 2019)

• Record Type: Journal Article
• Authors: COMBS, CHRISTIAN A.; SACKETT, DAN L.; KNUTSON, JAY R.
• Is Part Of: Journal of microscopy. Volume 274:Part 3(2019)
• Page Start: 168
• Page End: 176
• Publication Date: 2019-05-09
• Subjects: STED microscopy -- super‐resolution; Microscopy -- Periodicals; 502.82
• DOI: 10.1111/jmi.12795
• Languages: English
• ISSNs: 0022-2720

Abstract

Summary: Here we show an easy method for determining an effective dye saturation factor (' P STED ') for STED (Stimulated Emission Depletion) microscopy. We define P STED to be a combined microscope system plus dye factor (analogous to the traditional ground truth Is measurement, which is microscope independent) that is functionally defined as the power in the depletion beam that provides a resolution enhancement of 41% compared to confocal, according to the modified Abbe's formula for STED resolution enhancement. We show that the determination of P STED provides insight not only into the suitability of a particular dye and the best imaging parameters to be used for an experiment, but also sets the critical value for correctly determining the point spread function (PSF) used in deconvolution of STED images. P STED can be a function of many experimental variables, both microscope and sample related. Here we show the utility of doing P STED determinations by (1) exploiting the simple relationship between width and a threshold‐defined area provided by a Gaussian PSF, for either linear or spherical objects and (2) linearising the normally inverse hyperbolic function of resolution versus power that can determine P STED . We show that this rearrangement allows us to determine P STED using only a few measurements: either at a few relatively low depletion powers, on traditional bead size measurements or by finding the total area of a naturally occurring sub‐limit sized biological feature (in this case, microtubules). We show the derivation of these equations and methods and the utility of its use by characterising several dyes and a local imaging parameter relevant to STED microscopy. This information is used to predict the enhancement of resolution of the point spread function necessary for post‐processing deconvolution. Lay Description: Stimulated Emission Depletion (STED) microscopy is a fluorescence imaging superresolution technique that achieves tens of nanometres resolution. This is done by utilising a depletion laser to effectively quench (deplete) fluorescence in a donut shape overlapping the normally excited fluorescence spot. The size of the remaining (undepleted) central fluorescence spot is power dependent allowing 'tunable' resolution with the power of the STED depletion laser. This depletion power versus resolution relationship is dye and instrument dependent. We have developed a method for quickly measuring this relationship to optimise experiments based on individual dyes and microscope specific parameters. This allows for quickly optimising microscope settings and for correctly postprocessing images.