Studying the heterogeneity of the CrxTi1-xCh2 (Ch = S, Se) single crystals using X-ray scanning photoemission microscopy. (January 2022)

• Record Type: Journal Article
• Authors: Merentsov, A.I.; Shkvarin, A.S.; Postnikov, M.S.; Gregoratti, L.; Amati, M.; Zeller, P.; Moras, P.; Titov, A.N.
• Is Part Of: Journal of physics and chemistry of solids. Volume 160(2022)
• Publication Date: 2022-01
• Subjects: Titanium dichalcogenides -- Photoelectron spectroscopy -- Structural fragments -- Photoelectron microscopy -- Electronic structure; Solids -- Periodicals; Solides -- Périodiques; Solids; Periodicals; 530.41
• DOI: 10.1016/j.jpcs.2021.110309
• Languages: English
• ISSNs: 0022-3697

Abstract

Abstract: The morphology of the heterogeneous Crx Ti1-x Se2 and Crx Ti1-x S2 single crystals has been studied using X-ray scanning photoemission microscopy (SPEM) and angular resolved photoemission spectroscopy (ARPES). A direct method of SPEM provided us the insight into the origin of the blurred ARPES images for Cr0.78 Ti0.36 Se2 single crystal. Using SPEM, we confirmed the formation of the CrSe2 -based structural fragments inside the Crx Ti1-x Se2 single crystals with x ≥ 0.75. The chemical composition of the forming structural fragments depends on the chalcogen (S, Se) forming the crystal lattice. Graphical abstract: Image 1 Highlights: Crx Ti1-x Ch2 (Ch = S, Se) single crystals have been studied using SPEM Structural fragments with different composition are formed in both Se and S systems The fragments can be in coherent relation with each other The fragments in Cr0.78 Ti0.36 Se2 are TiSe2 -based and CrSe2 -based solid solutions The fragments in Cr0.34 Ti0.66 S2 are Crx Ti1-x+y S2 -based solid solutions with different concentration y of superstoichiometric Ti