Cite
HARVARD Citation
Li, N. et al. (2021). Effects of edge and interior stresses on electrical behaviors of piezoelectric semiconductor films. Ferroelectrics. 571 (1), pp. 96-108. [Online].
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Li, N. et al. (2021). Effects of edge and interior stresses on electrical behaviors of piezoelectric semiconductor films. Ferroelectrics. 571 (1), pp. 96-108. [Online].