Cite
HARVARD Citation
Wang, S. et al. (2022). A New TOC Measuring Device Based on UV Oxidation and Electrical Conductivity Measurement. Integrated ferroelectrics. 228 (1), pp. 142-156. [Online].
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Wang, S. et al. (2022). A New TOC Measuring Device Based on UV Oxidation and Electrical Conductivity Measurement. Integrated ferroelectrics. 228 (1), pp. 142-156. [Online].