A microstructure-dependent Kirchhoff plate model based on a reformulated strain gradient elasticity theory. Issue 17 (5th July 2022)

• Record Type: Journal Article
• Authors: Zhang, Gongye; Zheng, Chenyi; Mi, Changwen; Gao, Xin-Lin
• Is Part Of: Mechanics of advanced materials and structures. Volume 29:Issue 17(2022)
• Page Start: 2521
• Page End: 2530
• Publication Date: 2022-07-05
• Subjects: Buckling -- couple stress -- deflection -- free vibration -- Kirchhoff plate -- microstructure -- natural frequency -- size effect -- strain gradient; Composite materials -- Mechanical properties -- Periodicals; Composite construction -- Periodicals; 620.118
• DOI: 10.1080/15376494.2020.1870054
• Languages: English
• ISSNs: 1537-6494

Abstract

Abstract: A new microstructure-dependent non-classical model for Kirchhoff plates is developed by using a reformulated strain gradient elasticity theory that incorporates both the strain gradient and couple stress effects. The equation of motion and the boundary conditions are simultaneously obtained through a variational formulation based on Hamilton's principle. The new plate model contains one material constant to account for the strain gradient effect and one material length scale parameter to capture the couple stress effect. The newly developed non-classical plate model includes the plate model incorporating the couple stress effect alone and the plate model based on the classical elasticity as two special cases. To illustrate the new model, the buckling, static bending and free vibration problems of a simply supported rectangular plate are analytically solved by directly applying the general formulas derived. The numerical results reveal that the presence of the strain gradient and couple stress effects leads to reduced plate deflections, enlarged critical buckling loads and increased natural frequencies. These microstructure effects are significant when the plate is very thin, but they are diminishing as the plate thickness increases. These predicted trends of the size effects at the micron scale agree with those observed experimentally.