Buckling-induced quadratic nonlinearity in silicon phonon waveguide structures. (1st June 2022)

• Record Type: Journal Article
• Authors: Kurosu, Megumi; Hatanaka, Daiki; Okamoto, Hajime; Yamaguchi, Hiroshi
• Is Part Of: Japanese journal of applied physics. Volume 61:Number SD(2022)
• Publication Date: 2022-06-01
• Subjects: MEMS -- phonon waveguide -- nonlinearity -- mechanical nonlinearity; Physics -- Periodicals; 621.05
• DOI: 10.35848/1347-4065/ac5532
• Languages: English
• ISSNs: 0021-4922

Abstract

Abstract: We fabricated and characterized a single-crystal silicon phonon waveguide structure with lead zirconate titanate (PZT) piezoelectric transducers. The compressive stress in a silicon-on-insulator wafer causes a membrane waveguide to buckle, leading to the quadratic nonlinearity. The PZT transducer integrated in an on-chip configuration enables us to excite high-intensity mechanical vibration, which allows the characterization of nonlinear behavior. We observed a softening nonlinear response as a function of the drive power and demonstrated the mode shift and frequency conversion. This is the first report of the nonlinear behavior caused by the quadratic nonlinearity in a buckled phonon waveguide structure. This study provides a method to control the sign and the order of nonlinearity in a phonon waveguide by utilizing the internal stress, which allows the precise manipulation of elastic waves in phononic integrated circuits.