Estimation of minimum operating voltage in fully depleted SOI SRAM cells using gamma distribution. (1st May 2022)

• Record Type: Journal Article
• Authors: Yu, Hongkuan; Mizutani, Tomoko; Takeuchi, Kiyoshi; Saraya, Takuya; Kobayashi, Masaharu; Hiramoto, Toshiro
• Is Part Of: Japanese journal of applied physics. Volume 61:Number SC(2022)
• Publication Date: 2022-05-01
• Subjects: SRAM -- Minimum operating voltage -- Gamma distribution; Physics -- Periodicals; 621.05
• DOI: 10.35848/1347-4065/ac4447
• Languages: English
• ISSNs: 0021-4922

Abstract

Abstract: The minimum operating voltage ( V min ) of every cell on a 32 kb fully depleted SOI static random-access memory (SRAM) macro is successfully measured. Competing V min distribution models, which include the gamma and log-normal distributions, are approximated using the generalized gamma distribution. It is found that the V min of the cells follows the gamma distribution. This finding gives a simple method to estimate the worst V min of an SRAM macro by measuring a few samples and performing linear extrapolation from the gamma distribution.