Machine learning to probe modal interaction in dynamic atomic force microscopy. (1st November 2022)

• Record Type: Journal Article
• Authors: Belardinelli, P.; Chandrashekar, A.; Wiebe, R.; Alijani, F.; Lenci, S.
• Is Part Of: Mechanical systems and signal processing. Volume 179(2022)
• Publication Date: 2022-11-01
• Subjects: AFM -- Machine learning -- Data-driven -- QRNN -- Mode coupling -- Nonlinear dynamics; Structural dynamics -- Periodicals; Vibration -- Periodicals; Constructions -- Dynamique -- Périodiques; Vibration -- Périodiques; Structural dynamics; Vibration; Periodicals; 621
• DOI: 10.1016/j.ymssp.2022.109312
• Languages: English
• ISSNs: 0888-3270

Abstract

Abstract: Modal interactions are pervasive effects that commonly emerge in nanomechanical systems. The coupling of vibrating modes can be leveraged in many ways, including to enhance sensing or to disclose complex phenomenologies. In this work we show how machine learning and data-driven approaches could be used to capture intermodal coupling. We employ a quasi-recurrent neural network (QRNN) for identifying mode coupling and verify its applicability on experimental data obtained from tapping mode atomic force microscopy (AFM). Hidden units of the QRNN are monitored to trace fingerprints of modes activation and to quantify their contributions over the global distortion of orbits in the phase space. To demonstrate the broad applicability of the method, the trained model is re-applied over different experiments and on diverse materials. Over a range of tip-sample configurations, dynamic AFM possesses features general enough to be seized by the QRNN and it is not required an ad-hoc re-training for the identification of interacting modes. Our study opens up a route for utilizing established machine learning techniques for rapid recognition of nonlinear complex effect such as internal resonances in nanotechnology. The QRNN analysis is meant to assist AFM sensing operations when exploiting modal interaction to enhance the signal-to-noise ratio of higher harmonics and provide high resolution compositional contrast in multi-frequency AFM applications.