Resolution improvement of electrostatic ion analyzer using additional slit for laser ion source. Issue 1 (1st April 2022)

• Record Type: Journal Article
• Authors: Takahashi, K; Matsumoto, Y; Sasaki, T; Kikuchi, T
• Is Part Of: Journal of physics. Volume 2244:Issue 1(2022)
• Publication Date: 2022-04-01
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/2244/1/012089
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: A laser ion source provides an ion beam extracted from a drifting plasma produced by irradiating a high power laser on a solid target. Ion species contained in the plasma can be analyzed with an electrostatic ion analyzer (EIA). However, to distinguish ion species with close mass-to-charge ratio, high resolution is required due to the high drifting velocity. In order to improve the resolution of the EIA, we investigated the cause of spectral width broadening by simulation. The simulation result showed that the spectral broadening occurs because ions go through the paths in different angle rather than it is caused by difference of ion velocity in the conventional analyzer using two slits. To limit the angular distribution of the paths, we suggested to use an additional slit for the EIA. To demonstrate the effect of the additional slit on the spectral width broadening for the EIA, we investigated the variation in the spectral signals obtained with the suggested EIA. The experimental result indicated that the resolution of EIA can be improved by adding a slit to limit the trajectories in angular distribution of ion paths.