Characterization of Ag–In–S films prepared by thermal evaporation. (2022)

• Record Type: Journal Article
• Authors: Azhniuk, Yuriy M.; Gomonnai, Alexander V.; Solonenko, Dmytro; Lopushansky, Vasyl V.; Loya, Vasyl Y.; Voynarovych, Ivan M.; Roman, Ivan Y.; Zahn, Dietrich R.T.
• Is Part Of: Materials today. Volume 62:Part 9(2022)
• Page Start: 5745
• Page End: 5748
• Publication Date: 2022
• Subjects: Amorphous films -- Atomic force microscopy -- X-ray diffraction -- Raman spectroscopy; Materials science -- Congresses -- Periodicals; 620.1
• DOI: 10.1016/j.matpr.2022.01.488
• Languages: English
• ISSNs: 2214-7853

Abstract

Abstract: Ag–In–S films of various compositions were prepared by thermal evaporation. An atomic force microscopy (AFM) study shows that the prepared films are homogeneous with an average surface roughness from 4 to 5 nm (for a stoichiometric AgInS2 film) to about 11 nm (for a strongly Ag-deficient film). X-ray diffraction measurements reveal the amorphous structure of the films prepared with inclusions of silver crystallites for the stoichiometric and less Ag-deficient films. Raman spectra of the amorphous films demonstrate a good correlation with AgInS2 polycrystals and Ag–In–S nanocrystals and confirm the presence of all elements in the composition of the amorphous films while only part of Ag atoms is contained in Ag crystallites as evidenced by the X-ray data.