Disconnection-mediated migration of interfaces in microstructures: I. continuum model. (1st April 2022)

• Record Type: Journal Article
• Authors: Han, Jian; Srolovitz, David J.; Salvalaglio, Marco
• Is Part Of: Acta materialia. Volume 227(2022)
• Publication Date: 2022-04-01
• Subjects: Disconnections -- Interfaces -- Grain boundaries -- Microstructure -- Continuum modeling; Materials -- Periodicals; Materials science -- Periodicals; Materials -- Mechanical properties -- Periodicals; Metallurgy -- Periodicals; Chemistry, Inorganic -- Periodicals; 620.112
• DOI: 10.1016/j.actamat.2021.117178
• Languages: English
• ISSNs: 1359-6454

Abstract

Graphical abstract: Abstract: A long-standing goal of materials science is to understand, predict and control the evolution of microstructures in crystalline materials. Most microstructure evolution is controlled by interface motion; hence, the establishment of rigorous interface equations of motion is a universal goal of materials science. We present a new model for the motion of arbitrarily curved interfaces that respects the underlying crystallography of the two phases/domains meeting at the interface and is consistent with microscopic mechanisms of interface motion; i.e., disconnection migration (line defects in the interface with step and dislocation character). We derive the equation of motion for interface migration under the influence of a wide range of driving forces. In Part II of this paper [Salvalaglio, Han and Srolovitz, 2021], we implement the interface model and the equation of motion proposed in this paper in a diffuse interface simulation approach for complex morphology and microstructure evolution.