AXON Dose: A Solution for Measuring and Managing Electron Dose in the TEM. (July 2022)

• Record Type: Journal Article
• Authors: Damiano, John; Walden, Stamp; Franks, Alan; Marusak, Kate; Larson, Ben; Coy, Mike; Nackashi, David
• Is Part Of: Microscopy today. Volume 30:Number 4(2022)
• Page Start: 22
• Page End: 25
• Publication Date: 2022-07
• Subjects: in situ electron microscopy -- transmission electron microscopy -- electron dose -- dose rate -- beam damage; Microscope and microscopy -- Periodicals; 502.8
• DOI: 10.1017/S1551929522000840
• Languages: English
• ISSNs: 1551-9295

Abstract

Abstract : Abstract: The interaction of the electron beam with materials during TEM/STEM imaging often leads to radiation damage. While a variety of low-dose techniques can help mitigate beam damage, true dose management starts with knowing the precise total accumulated dose and dose rate that a sample has seen throughout an experiment. AXON Dose allows users to calibrate their instruments, track electron dose/dose rate across a sample as a function of time and location, and quantify the impact of dose on individual samples.