The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes. (August 2022)
- Record Type:
- Journal Article
- Title:
- The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes. (August 2022)
- Main Title:
- The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes
- Authors:
- Op de Beeck, Jonathan
Scheerder, Jeroen E.
Geiser, Brian P.
Bunton, Joseph H.
Ulfig, Robert M.
Larson, David J.
van der Heide, Paul
Vandervorst, Wilfried
Fleischmann, Claudia - Abstract:
- Abstract: Abstract : Reliable spatially resolved compositional analysis through atom probe tomography requires an accurate placement of the detected ions within the three-dimensional reconstruction. Unfortunately, for heterogeneous systems, traditional reconstruction protocols are prone to position some ions incorrectly. This stems from the use of simplified projection laws which treat the emitter apex as a spherical cap, although the actual shape may be far more complex. For instance, sampled materials with compositional heterogeneities are known to develop local variations in curvature across the emitter due to their material phase specific evaporation fields. This work provides three pivotal precursors to improve the spatial accuracy of the reconstructed volume in such cases. First, we show scanning probe microscopy enables the determination of the local curvature of heterogeneous emitters, thus providing the essential information for a more advanced reconstruction considering the actual shape. Second, we demonstrate the cyclability between scanning probe characterization and atom probe analysis. This is a key ingredient of more advanced reconstruction protocols whereby the characterization of the emitter topography is executed at multiple stages of the atom probe analysis. Third, we show advances in the development of an electrostatically driven reconstruction protocol which are expected to enable reconstruction based on experimental tip shapes.
- Is Part Of:
- Microscopy and microanalysis. Volume 28:Number 4(2022)
- Journal:
- Microscopy and microanalysis
- Issue:
- Volume 28:Number 4(2022)
- Issue Display:
- Volume 28, Issue 4 (2022)
- Year:
- 2022
- Volume:
- 28
- Issue:
- 4
- Issue Sort Value:
- 2022-0028-0004-0000
- Page Start:
- 1141
- Page End:
- 1149
- Publication Date:
- 2022-08
- Subjects:
- atom probe tomography -- emitter shape -- local magnification -- reconstruction -- scanning probe microscopy
Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82 - Journal URLs:
- https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗ - DOI:
- 10.1017/S143192762101357X ↗
- Languages:
- English
- ISSNs:
- 1431-9276
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 22269.xml