A guide to nanoscale IR spectroscopy: resonance enhanced transduction in contact and tapping mode AFM-IR. (26th May 2022)

• Record Type: Journal Article
• Authors: Schwartz, Jeffrey J.; Jakob, Devon S.; Centrone, Andrea
• Is Part Of: Chemical Society reviews. Volume 51:Number 13(2022)
• Page Start: 5248
• Page End: 5267
• Publication Date: 2022-05-26
• Subjects: Chemistry -- Periodicals; 540
• DOI: 10.1039/d2cs00095d
• Languages: English
• ISSNs: 0306-0012

Abstract

Abstract : By combining capabilities of atomic force microscopy (AFM) with infrared (IR) spectroscopy, AFM-IR resolves nanoscale compositional details. This tutorial reviews technical breakthroughs, working principles, best practices, and future prospects of AFM-IR. Abstract : Infrared (IR) spectroscopy is a broadly applicable, composition sensitive analytical technique. By leveraging the high spatial resolution of atomic force microscopy (AFM), the photothermal effect, and wavelength-tunable lasers, AFM-IR enables IR spectroscopy and imaging with nanoscale (< 10 nm) resolution. The transduction of a sample's photothermal expansion by an AFM probe tip ensures the proportionality between the AFM-IR signal and the sample absorption coefficient, producing images and spectra that are comparable to far-field IR databases and easily interpreted. This convergence of characteristics has spurred robust research efforts to extend AFM-IR capabilities and, in parallel, has enabled AFM-IR to impact numerous fields. In this tutorial review, we present the latest technical breakthroughs in AFM-IR spectroscopy and imaging and discuss its working principles, distinctive characteristics, and best practices for different AFM-IR measurement paradigms. Central to this review, appealing to both expert practitioners and novices alike, is the meticulous understanding of AFM-IR signal transduction, which is essential to take full advantage of AFM-IR capabilities. Here, we critically compile key information and discuss instructive experiments detailing AFM-IR signal transduction and provide guidelines linking experimental parameters to the measurement sensitivity, lateral resolution, and probed depth. Additionally, we provide in-depth tutorials on the most employed AFM-IR variants (resonance-enhanced and tapping mode AFM-IR), discussing technical details and representative applications. Finally, we briefly review recently developed AFM-IR modalities (peak force tapping IR and surface sensitivity mode) and provide insights on the next exciting opportunities and prospects for this fast-growing and evolving field.