RTS noise in semiconductor devices: time constants estimates and observation window analysis. (1st April 2022)

• Record Type: Journal Article
• Authors: da Silva, Roberto; Wirth, Gilson
• Is Part Of: Journal of statistical mechanics. (2022:Apr.)
• Publication Date: 2022-04-01
• Subjects: current fluctuations -- fluctuation phenomena -- interfaces in random media -- noise models; Statistical mechanics -- Periodicals; Mechanics -- Statistical methods -- Periodicals; 530.1305
• DOI: 10.1088/1742-5468/ac5dbf
• Languages: English
• ISSNs: 1742-5468

Abstract

Abstract: We obtained a semi-analytical treatment considering estimators for the variance and variance of variance for the RTS noise as a function of the time observation. Our method also suggests a way to experimentally determine the constants of capture and emission in the case of a dominant trap and universal behaviors for the superposition from many traps. We present detailed closed-form expressions corroborated by MC simulations. We are sure to have an important tool to guide developers in building and analyzing low-frequency noise in semiconductor devices.