Extracting the local electronic states of Pt polycrystalline films surface under electrochemical conditions using polarization-dependent total reflection fluorescence x-ray absorption near edge structure spectroscopy. (24th December 2020)

• Record Type: Journal Article
• Authors: Wakisaka, Yuki; Uehara, Hiromitsu; Yuan, Qiuyi; Kido, Daiki; Wada, Takahiro; Uo, Motohiro; Uemura, Yohei; Yokoyama, Toshihiko; Kamei, Yutaro; Kuroda, Seiichi; Ohira, Akihiro; Takakusagi, Satoru; Asakura, Kiyotaka
• Is Part Of: Electronic structure. Volume 2:Number 4(2020)
• Publication Date: 2020-12-24
• Subjects: fuel cell -- XAFS -- surface -- in situ -- total reflection; Electronic structure -- Periodicals; 530.411
• DOI: 10.1088/2516-1075/abd1ca
• Languages: English
• ISSNs: 2516-1075

Abstract

Abstract: The local atomic information about the interface between the 30 nm-thick Pt polycrystalline films and the solution with and without perfluorosulfonic acid polymers (Nafion®) for the model cathode catalyst of fuel cell has been captured under electrochemical conditions using polarization-dependent total reflection fluorescence x-ray absorption near edge structure spectroscopy (PTRF–XANES). The results show that the formation of sub-monolayer-equivalent PtO or adsorbed hydrogen/oxygen species in the surface region can be successfully observed in the PTRF–XANES spectra when the thickness of the solution layer and the incidence angle are properly controlled. This capability enables us to examine the metal /(Nafion®/) solution interface structure through XANES together with other surface analysis methods, which will enhance comprehensive understanding of the nature of the interface of the fuel cell system.