Corrigendum: "A robust single device MOSFET series resistance extraction method considering horizontal-field-dependent mobility" [Jpn. J. Appl. Phys. 61, SC1016 (2022)]. (1st April 2022)

Record Type:: Journal Article
Title:: Corrigendum: "A robust single device MOSFET series resistance extraction method considering horizontal-field-dependent mobility" [Jpn. J. Appl. Phys. 61, SC1016 (2022)]. (1st April 2022)
Main Title:: Corrigendum: "A robust single device MOSFET series resistance extraction method considering horizontal-field-dependent mobility" [Jpn. J. Appl. Phys. 61, SC1016 (2022)]
Authors:: Takeuchi, Kiyoshi
Mizutani, Tomoko
Saraya, Takuya
Kobayashi, Masaharu
Hiramoto, Toshiro
Abstract:
Is Part Of:: Japanese journal of applied physics. Volume 61:Number 4(2022)
Journal:: Japanese journal of applied physics
Issue:: Volume 61:Number 4(2022)
Issue Display:: Volume 61, Issue 4 (2022)
Year:: 2022
Volume:: 61
Issue:: 4
Issue Sort Value:: 2022-0061-0004-0000
Page Start:
Page End:
Publication Date:: 2022-04-01
Subjects:: Physics -- Periodicals
621.05
Journal URLs:: http://iopscience.iop.org/1347-4065/ ↗
http://ioppublishing.org/ ↗
DOI:: 10.35848/1347-4065/ac5dfb ↗
Languages:: English
ISSNs:: 0021-4922
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store
Ingest File:: 21930.xml