A probabilistic approach to tomography and adjoint state methods, with an application to full waveform inversion in medical ultrasound. (1st April 2022)

• Record Type: Journal Article
• Authors: Bates, Oscar; Guasch, Lluis; Strong, George; Caradoc Robins, Thomas; Calderon-Agudo, Oscar; Cueto, Carlos; Cudeiro, Javier; Tang, Mengxing
• Is Part Of: Inverse problems. Volume 38:Number 4(2022)
• Publication Date: 2022-04-01
• Subjects: tomography -- Bayesian methods -- stochastic variational inference -- adjoint method -- full-waveform inversion; Inverse problems (Differential equations) -- Periodicals; 515.357
• DOI: 10.1088/1361-6420/ac55ee
• Languages: English
• ISSNs: 0266-5611

Abstract

Abstract: Bayesian methods are a popular research direction for inverse problems. There are a variety of techniques available to solve Bayes' equation, each with their own strengths and limitations. Here, we discuss stochastic variational inference (SVI), which solves Bayes' equation using gradient-based methods. This is important for applications which are time-limited (e.g. medical tomography) or where solving the forward problem is expensive (e.g. adjoint methods). To evaluate the use of SVI in both these contexts, we apply it to ultrasound tomography of the brain using full-waveform inversion (FWI). FWI is a computationally expensive adjoint method for solving the ultrasound tomography inverse problem, and we demonstrate that SVI can be used to find a no-cost estimate of the pixel-wise variance of the sound-speed distribution using a mean-field Gaussian approximation. In other words, we show experimentally that it is possible to estimate the pixel-wise uncertainty of the sound-speed reconstruction using SVI and a common approximation which is already implicit in other types of iterative reconstruction. Uncertainty estimates have a variety of uses in adjoint methods and tomography. As an illustrative example, we focus on the use of uncertainty for image quality assessment. This application is not limiting; our variance estimator has effectively no computational cost and we expect that it will have applications in fields such as non-destructive testing or aircraft component design where uncertainties may not be routinely estimated.