Impact of Co on the Ni0.9Co0.1-Ge0.9Sn0.1 Solid-State Reaction and Properties. (22nd October 2019)

• Record Type: Journal Article
• Authors: Quintero, Andrea; Gergaud, Patrice; Hartmann, Jean-Michel; Reboud, Vincent; Cassan, Eric; Rodriguez, Philippe
• Is Part Of: ECS transactions. Volume 93:Number 1(2019)
• Page Start: 51
• Page End: 55
• Publication Date: 2019-10-22
• Subjects: Electrochemistry -- Periodicals; Electrochemistry; Periodicals; Electronic journals; Electronic journal; 541.37
• DOI: 10.1149/09301.0051ecst
• Languages: English
• ISSNs: 1938-5862

Abstract

Abstract : A systematic and comprehensive study concerning the solid-state reaction between Ni0.9 Co0.1 and Ge0.9 Sn0.1 layers was carried out. Special attention was paid on the impact of adding 10 at.% of Co in the Ni metallization layer. In-situ X-ray Diffraction (XRD), atomic force microscopy (AFM) and Sheet resistance (Rsh ) measurements were performed in order to follow the solid-state reaction, surface morphology and electrical properties evolution, as the temperature increases.