Direct detection of charged particles with SiPMs. (1st June 2022)

• Record Type: Journal Article
• Authors: Carnesecchi, F.; Vignola, G.; Agrawal, N.; Alici, A.; Antonioli, P.; Arcelli, S.; Bellini, F.; Cavazza, D.; Cifarelli, L.; Colocci, M.; Durando, S.; Ercolessi, F.; Garbini, M.; Giacalone, M.; Hatzifotiadou, D.; Jacazio, N.; Margotti, A.; Malfattore, G.; Nania, R.; Noferini, F.; Pinazza, O.; Preghenella, R.; Ricci, R.; Rignanese, L.; Rubini, N.; Scapparone, E.; Scioli, G.; Strazzi, S.; Tripathy, S.; Zichichi, A.
• Is Part Of: Journal of instrumentation. Volume 17:Number 6(2022)
• Publication Date: 2022-06-01
• Subjects: Particle tracking detectors (Solid-state detectors) -- Timing detectors -- Photon detectors for UV, visible and IR photons (solid-state) (PIN diodes, APDs, Si-PMTs, G-APDs, CCDs, EBCCDs, EMCCDs, CMOS imagers, etc); Scientific apparatus and instruments -- Periodicals; 502.84
• DOI: 10.1088/1748-0221/17/06/P06007
• Languages: English
• ISSNs: 1748-0221

Abstract

Abstract: The direct response of Silicon PhotoMultipliers being traversed by a MIP charged particle have been studied in a systematic way for the first time. Using beam test data, time resolution and the crosstalk probability have been measured. A characterization of the SiPM by means of a laser beam is also reported. The results obtained for different sensors indicate a measured time resolution around 40–70 ps. Although particles are expected to traverse only one SPAD per event, crosstalk measurements on different sensors indicate an unexpected higher value with respect to the one related to the sensor noise.