Cite
HARVARD Citation
Tu, Y. et al. (2022). Analysis of self-heating-related instability in n-channel low-temperature polysilicon TFTs with different S/D contact hole densities. Applied physics express. p. . [Online].
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Tu, Y. et al. (2022). Analysis of self-heating-related instability in n-channel low-temperature polysilicon TFTs with different S/D contact hole densities. Applied physics express. p. . [Online].